Qualcomm: >> Snapdragon 7c Gen 2 Compute Platform Security Vulnerabilities
Memory Corruption when multiple threads issue concurrent IOCTL requests to the device control handler due to improper synchronization and race conditions.
CVSS Score
7.8
EPSS Score
0.001
Published
2026-09-17
Transient DOS when processing authentication frames with invalid FILS information element header lengths.
CVSS Score
7.5
EPSS Score
0.003
Published
2026-09-17
Memory Corruption when processing data with large offset and length values exceeds buffer limits during data copy operations.
CVSS Score
7.8
EPSS Score
0.002
Published
2026-09-17
Memory Corruption when processing registry values with incorrect types using a direct query method.
CVSS Score
6.7
EPSS Score
0.001
Published
2026-08-04
Memory corruption in diagnostic services due to absence of input validation
CVSS Score
6.7
EPSS Score
0.001
Published
2026-06-01
Memory Corruption when processing auxiliary sensor input/output control commands with insufficient buffer size validation.
CVSS Score
7.8
EPSS Score
0.001
Published
2026-04-06
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing in a camera sensor driver.
CVSS Score
7.8
EPSS Score
0.001
Published
2026-04-06
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing in a camera sensor driver.
CVSS Score
7.8
EPSS Score
0.001
Published
2026-04-06
Memory Corruption when retrieving output buffer with insufficient size validation.
CVSS Score
7.8
EPSS Score
0.001
Published
2026-04-06
Memory Corruption when accessing an output buffer without validating its size during IOCTL processing.
CVSS Score
7.8
EPSS Score
0.001
Published
2026-04-06
Page 1