Qualcomm: >> Fastconnect 6200 Firmware Security Vulnerabilities
Memory Corruption when processing device identifier strings that exceed the expected maximum length.
CVSS Score
7.8
EPSS Score
0.0
Published
2026-06-01
Memory Corruption when writing to invalid memory locations occurs due to heap memory exhaustion during secure data initialization.
CVSS Score
7.8
EPSS Score
0.0
Published
2026-06-01
Memory corruption while creating a process on the digital signal processor due to allocation failure at the kernel level.
CVSS Score
7.8
EPSS Score
0.0
Published
2026-05-04
Memory corruption when another driver calls an IOCTL with invalid input/output buffer.
CVSS Score
7.8
EPSS Score
0.0
Published
2026-05-04
Memory Corruption when copying data from a freed source while executing performance counter deselect operation.
CVSS Score
7.8
EPSS Score
0.0
Published
2026-05-04
Transient DOS when processing target power rate tables during channel configuration.
CVSS Score
6.5
EPSS Score
0.0
Published
2026-05-04
Transient DOS when processing a malformed Fast Transition response frame with an invalid header structure during wireless roaming.
CVSS Score
6.5
EPSS Score
0.0
Published
2026-05-04
Memory corruption when dynamically changing the size of a previously allocated buffer while its contents are being modified.
CVSS Score
6.5
EPSS Score
0.0
Published
2026-05-04
Transient DOS when receiving a service data frame with excessive length during device matching over a neighborhood awareness network protocol connection.
CVSS Score
7.6
EPSS Score
0.0
Published
2026-04-06
Memory Corruption when processing auxiliary sensor input/output control commands with insufficient buffer size validation.
CVSS Score
7.8
EPSS Score
0.0
Published
2026-04-06