Qualcomm: >> Snapdragon 8+ Gen 2 Mobile Platform Security Vulnerabilities
Transient DOS when a remote device sends an invalid connection request during BT connectable LE scan.
CVSS Score
6.5
EPSS Score
0.0
Published
2025-11-04
Memory corruption while performing encryption and decryption commands.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-11-04
Memory corruption while processing a malformed license file during reboot.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-10-09
Memory corruption during PlayReady APP usecase while processing TA commands.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-10-09
Transient DOS while parsing the EPTM test control message to get the test pattern.
CVSS Score
7.5
EPSS Score
0.001
Published
2025-09-24
memory corruption while loading a PIL authenticated VM, when authenticated VM image is loaded without maintaining cache coherency.
CVSS Score
7.8
EPSS Score
0.0
Published
2025-09-24
Memory corruption while selecting the PLMN from SOR failed list.
CVSS Score
9.8
EPSS Score
0.001
Published
2025-09-24
Information disclosure while decoding RTP packet received by UE from the network, when payload length mentioned is greater than the available buffer length.
CVSS Score
8.2
EPSS Score
0.0
Published
2025-09-24
Information disclosure while decoding this RTP packet headers received by UE from the network when the padding bit is set.
CVSS Score
8.2
EPSS Score
0.0
Published
2025-09-24
Memory corruption when the UE receives an RTP packet from the network, during the reassembly of NALUs.
CVSS Score
9.8
EPSS Score
0.001
Published
2025-09-24
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